Electron
  Microscopy Group
Facilities: 2000FX
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JEOL 2000FX TEM

Location: HREM building room 823

The JEOL 2000FX is a 200kV analytical TEM/STEM with a LaB6 source, which was installed in 1988.


Facilities available on this instrument include:

Liquid nitrogen, helium holders and low background double tilt sample holders

Parallel energy loss spectrometry (PEELS)

An ultra-thin window (UTW) X-ray detector

Secondary electron (SE) and back-scattered electron (BSE) detectors