The JEOL 200CX is a 200kV analytical TEM/STEM with a W source,
which was installed in 1996.
This is a simple, easy-to-use transmission electron microscope used for imaging (bright-field and dark-field) and diffraction (selected area and convergent beam). It has a scanning unit for STEM images.
The electron source is a tungsten filament (brightness = 2 x 109 A/m2 sr), which allows quick, convenient imaging from low magnification (100 times) to moderately high (330 000 times). It has four specimen holders including motorised double-tilt, non-motorised beryllium double tilt, two double-sample single-tilt holders and an Oxford Instruments double-tilt heating holder (up to 1000C).
The camera uses negatives (50 plate capacity) for large field of view (FOV), high-density image capture.