Electron
  Microscopy Group
Facilities: 5800
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JEOL 5800 LV SEM

The JEOL 5800 is a is a variable pressure SEM with a W source, which was installed in 1996.


Facilities available on this instrument include:

A UTW X-ray detector

BSE and SE detectors

Low vacuum (LV) mode for non-conducting specimens

BSE and SE detectors

Fully integrated digital acquisition

Back-scatter diffraction camera (for EBSD) and orientation imaging (OIM) software