Electron
  Microscopy Group
Facilities: CM300
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Philips CM300 FEGTEM

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The Philips CM300 is a state-of-the-art 300kV field emission gun (FEG) high resolution and analytical TEM/STEM, which was installed in 1999.

The field emission source means this microscope is ideal for applications requiring high coherency, high brightness at high magnification, or small focused probes.

Applications that require high coherency include electron holography and Fresnel defocus imaging, while high brightness applications include energy filtered microscopy, and focused probes are ideal for EDX, EELS and all STEM work.

The microscope has a SuperTwin objective lens with a maximum sample tilt range of ▒60░ (using a tomography holder) and a Cs of 1.2ámm. It has a point resolution of 0.2 nm and an information limit of 0.12 nm. The minimum focused probe size is 0.3 nm.


Facilities available on this instrument include:

Single tilt tomography, single tilt electrical, double tilt liquid nitrogen and double tilt low background sample holders

Three fold objective and condenser stigmators

A Gatan Imaging Filter (GIF) 2002, fitted with a 2k x 2k CCD camera, for energy-filtered diffraction, imaging and EELS.

Off-axis STEM bright-field (BF) and dark-field (DF) detectors

On-axis high sensitivity (single electron detection) Fischione Model 3000 high angle annular dark field (HAADF) detector for high-resolution Z-contrast imaging

EMISPEC data acquisition system running ESVison for recording any combination of CCD, EELS, X-ray, BF, ADF and HAADF signals

An EDAX r-TEM ultra-thin window (UTW) X-ray detector

A Lorentz lens for high-resolution magnetic imaging

An electrostatic biprism for off-axis electron holography

A Balzers Prisma mass spectrometer connected to the objective polepiece for diagnosis of vacuum problems and analysis of specimen damage mechanisms


Use of this microscope is restricted to specifically trained individuals. Contact Jon Barnard (jsb43) for training.