The Philips CM300 is a state-of-the-art 300kV field emission gun (FEG) high resolution and analytical TEM/STEM,
which was installed in 1999.
The field emission source means this microscope is ideal for applications requiring high coherency, high brightness at high magnification, or small focused
Applications that require high coherency include electron holography and Fresnel defocus
imaging, while high brightness applications include energy filtered microscopy, and focused probes
are ideal for EDX, EELS and all STEM work.
The microscope has a SuperTwin objective lens with a maximum sample tilt range of ▒60░ (using a
tomography holder) and a Cs of 1.2ámm. It has a point resolution of 0.2 nm and an information
limit of 0.12 nm. The minimum focused probe size is 0.3 nm.
Facilities available on this instrument include:
Single tilt tomography, single tilt electrical, double tilt liquid nitrogen and double tilt low background sample
Three fold objective and condenser stigmators
A Gatan Imaging Filter (GIF) 2002, fitted with a 2k x 2k CCD camera, for energy-filtered diffraction, imaging and EELS.
Off-axis STEM bright-field (BF) and dark-field (DF) detectors
On-axis high sensitivity (single electron detection) Fischione Model 3000 high angle annular dark field (HAADF) detector for high-resolution Z-contrast imaging
EMISPEC data acquisition system running ESVison for recording any combination of CCD, EELS, X-ray, BF, ADF and HAADF signals
An EDAX r-TEM ultra-thin window (UTW) X-ray detector
A Lorentz lens for high-resolution magnetic imaging
An electrostatic biprism for off-axis electron holography
A Balzers Prisma mass spectrometer connected to the objective polepiece for diagnosis of vacuum problems and analysis of specimen damage mechanisms
Use of this microscope is restricted to specifically trained individuals. Contact Jon Barnard (jsb43) for training.