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  Microscopy Group
People: Owen Saxton
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Dr W. Owen Saxton

M.A., Ph.D. (Cambridge)

Department of Materials Science and Metallurgy
University of Cambridge
27 Charles Babbage Road
Cambridge CB3 0FS

Office: 0_025
Tel: +44 1223 334566
Fax: +44 1223 334567
Email: wos1@cam.ac.uk

Research
Recent Publications

Owen Saxton is a Senior Research Associate applying computer image processing to solve inverse imaging and inverse scattering problems in electron microscopy: doubling the resolution, extracting structures buried in noise, and recovering specimen potential / field distributions.

Following a PhD under Peter Hawkes, he has held a series of research fellowships and other posts, and was awarded the 1996 Ernst Ruska Prize for his work on the phase problem and the development of the Semper image processing system. He is a non-executive director (and co-founder) of Synoptics Ltd, which supported his research for some years, and a Fellow of New Hall, where he is currently Admissions Tutor and Director of Studies for Natural Sciences (Physical).

Owen Saxton's Research

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1. ABERRATION MEASUREMENT IN HIGH RESOLUTION IMAGES

Collaborators: Dr A I Kirkland, R R Meyer

Determination of defocus, astigmatism, beam misalignment, three-fold astigmatism and spherical aberration in high resolution images, by analysing image shifts, diffractogram shapes and diffractogram symmetry axis orientation as a function of lens and beam deflector currents.

2. RESOLUTION DOUBLING IN HIGH RESOLUTION IMAGES

Collaborators: Dr A I Kirkland, R R Meyer, Dr J L Hutchison (Oxford), Dr J Sloan (Oxford)

Aberration-compensated exit plane wavefunction reconstruction by Fourier synthesis from sets of images with different beam tilt or defocus. Revealing cation column locations with twice the accuracy otherwise possible, and at least detecting light anions (oxygen).

3. PHASE RECOVERY FROM INTENSITY MEASUREMENTS

Collaborators: Dr R E Dunin-Borkowski, Dr C B Boothroyd, Dr S J Lloyd, P K Somodi

Recovery of potential and magnetic flux density in the specimen via direct phase recovery from pairs/sets of images at different defocus, variously using the "transport of intensity" approach in real space, Fourier synthesis and the Gerchberg-Saxton algorithm.

4. 3-D STRUCTURES OF 2-D PROTEIN CRYSTALS

Collaborators: Prof W Baumeister, Dr R Hegerl (MPI Biochemistry, Munich)

Recovery of 3-D structures from distorted fragments of 2-D crystals of biological macromolecules, by combining projections obtained by "correlation averaging" with local distortion compensation.

Owen Saxton's Recent Publications

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Journal Papers

A I Kirkland and W O Saxton
Cation segregation in NbWO using high angle anular dark field scanning transmission electron microscopy and image processing
J. Microsc. 206 (2002), 1-6

W O Saxton
A new way of measuring microscope aberrations
Ultramicroscopy 81 (2000), 41-45

A I Kirkland, W O Saxton and R R Meyer
Indirect super-resolved microscopy: aberration compensation and image reconstruction of tilt-azimuth data
In: The Electron, Ed. A I Kirkland and P D Brown (1998) pp 426-436. (London: Inst. of Metals)

R E Dunin-Borkowski and W O Saxton
The electrostatic contribution to the forward scattering potential at a space charge layer in high energy electron diffraction. II Fringing fields
Acta Cryst. 53 (1997), 242-50.

A I Kirkland, W O Saxton and G Chand
Multiple beam tilt microscopy for super resolved imaging
J. Electron Microsc. 46 (1997), 11-22.

W O Saxton
Quantitative comparison of images and transforms.
J. Microsc. 190 (1997), 52-60.

Conference Papers

2001

R R Meyer, A I Kirkland and W O Saxton
A new method for the determination of the coefficients of the wave aberration function
In: Electron Microscopy & Analysis 2001 (Ed. M Aindow and C J Kiely)
Inst. Phys. Conf. Ser. No. 168 (2001), pp 23-26

O S Makin, W O Saxton, J C Loudon, S J Lloyd and P A Midgley
Direct specimen plane wave recovery for strong objects.
In: Electron Microscopy & Analysis 2001 (Ed. M Aindow and C J Kiely)
Inst. Phys. Conf. Ser. No. 168 (2001), pp 139-142

2000

A I Kirkland, J Sloan, R Meyer, R E Dunin-Borkowski, J L Hutchison, W O Saxton, M J Sayagues and R J D Tilley
Super-resolution imaging of complex metal oxides
Proc. 12th Eur. Cong. Electron Microsc. 3 (2000), 159-160

R R Meyer, A I Kirkland and W O Saxton
A new method for the determination for the wave aberration function
Proc. 12th Eur. Cong. Electron Microsc. 3 (2000), 165-166

1999

W O Saxton
Using crystal wedges to solve the inverse scattering problem
In: Electron Microscopy & Analysis 1999 (Ed. C J Kiely)
Inst. Phys. Conf. Ser. No. 161 (1999), pp 165-168

A I Kirkland, R E Dunin-Borkowski, J L Hutchison and W O Saxton
Comprehensive characterisation of a FEGTEM
In Electron Microscopy & Analysis 1999 (Ed. C J Kiely)
Inst. Phys. Conf. Ser. No. 161 (1999), pp 259-262

R R Meyer, A I Kirkland and W O Saxton
Accurate characterisation of CCD cameras for electron detection
In: Electron Microscopy & Analysis 1999 (Ed. C J Kiely)
Inst. Phys. Conf. Ser. No. 161 (1999), pp 267-270

A I Kirkland, R R Meyer, W O Saxton, J L Hutchison and R E Dunin-Borkowski
Indirect super-resolved microscopy in the TEM
In: Electron Microscopy & Analysis 1999 (Ed. C J Kiely)
Inst. Phys. Conf. Ser. No. 161 (1999), pp 291-294

R R Meyer, A I Kirkland and W O Saxton
Comprehensive automation of the TEM: a new method for the accurate determination of the imaging conditions for arbitrary specimens
In: Electron Microscopy & Analysis 1999 (Ed. C J Kiely)
Inst. Phys. Conf. Ser. No. 161 (1999), pp 295-298

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