Electron
  Microscopy Group
Research: Electron Tomography
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See also Research pages for Introduction, Electron Diffraction, Superconductivity, Nanomaterials, EELS, Dual Beam, Cs corrected STEM

 

 



The complexity of modern materials and devices demands highly sophisticated characterisation techniques that enable high spatial resolution information to be gleaned in two and three dimensions. Electron tomography is a high spatial resolution technique that allows quantitative information to be reconstructed using a series of 2-dimensional images. A number of different imaging modes can be used: STEM tomography can reveal 3D morphological changes, EFTEM and EELS tomography 3D composition, holographic tomography electro-magnetic potentials and diffraction contrast tomography can reveal the distribution of dislocations in a 3D network.

Electron tomography can be undertaken either in the TEM or dual-beam FIB SEM - for dual beam research click here .




Examples of research on electron tomography include:

STEM Tomography of Catalysts

Holo-Tomography of Semiconductor Devices

Nanostructured Materials

Dark-field Tomography of Dislocations

EFTEM Tomography