Paul Midgley is Professor of Materials Science and Director of the Electron Microscopy Facility.
He is a Fellow of the Royal Society and a Professorial Fellow at Peterhouse.
Before moving to Cambridge in 1997, he held two Research Fellowships in the H.H. Wills Physics Laboratory at the University of Bristol,
the first funded by The Royal Commission for The Exhibition of 1851 and the second by The Royal
He has studied a wide variety of materials by electron microscopy and developed a number of novel electron microscopy techniques.
His recent research has concentrated on electron tomography, electron holography, energy filtered TEM and precession electron diffraction.
1. ELECTRON TOMOGRAPHY
3D Reconstruction of Nano-Structures. By recording a tilt series of scanning transmission electron micrographs using high angle
scattering or energy filtered images using fixed beam methods it is possible to reconstruct the 3-dimensional structure and compostion of nanoscale
2. ELECTRON HOLOGRAPHY
Using a field emission TEM, off-axis and in-line (Fresnel) electron holography is being used to study a variety of material
properties: Electric Fields in biased and non-biased p-n junctions, metal oxide grain
boundaries and ferroelectrics; Magnetic Fields in magnetic nanowires, thin film devices and small single
3. ENERGY-FILTERED IMAGING AND DIFFRACTION
A number of new techniques have been established to improve the accuracy of core-loss (energy-filtered)
imaging of mixed-phase samples.
Hybrid modes, such as spectrum-imaging and w-q maps have also been used for more fundamental studies, e.g. plasmon
dispersion, surface losses and Cerenkov radiation.
4. AB-INITIO STRUCTURE DETERMINATION BY ELECTRON DIFFRACTION
Using a combination of high resolution electron microscopy, conventional electron
diffraction and electron precession, the structure of sub-micron particles can now be determined to an accuracy
approaching that of X-ray diffraction.
Twitchett A.C., Dunin-Borkowski R.E. and Midgley P.A.
Quantitative electron holography of biased semiconductor
Phys. Rev. Lett. 88 (2002) 238302
Loudon J.C., Mathur N. and Midgley P.A.
Charge-ordered ferromagnetic phase in
Nature 420 (2002) 797
Midgley P.A. and Weyland M.
3D Electron Microscopy in the Physical Sciences: the Development of
Z-contrast and EFTEM Tomography
Ultramicroscopy 96 (2003) 413
Arslan I., Yates T.J.V., Browning N.D. and Midgley P.A.
Embedded Nanostructures revealed in Three Dimensions
Science 309 (2005) 2195
Loudon J.C., Cox, S., Williams A., Attfield P., Littlewood P.B., Midgley
P.A. and Mathur N.D.
Weak charge-lattice coupling requires reinterpretation of stripes of
charge order in La1-xCaxMnO3
Phys. Rev. Lett. 94 (2005) 097202
Tong J, Arslan I and Midgley PA
A novel dual-axis iterative algorithm for electron tomography
Journal of Structural Biology 153 (2006) 55
Gass M.H., Koziol K. K., Windle A.H. and Midgley P.A.,
Four-Dimensional Spectral Tomography of Carbonaceous
Nano Letters 6 (3) (2006) 376
Barnard J. S., Sharp J., Tong J. R. and Midgley P. A.
High-Resolution Three-Dimensional Imaging of Dislocations
Science 313 (2006) 319
Loudon J. and Midgley P.A.
Micromagnetic Imaging to Determine the Nature of the Ferromagnetic
Phase Transition in
Phys. Rev. Lett. 96 (2006) 027214
Kaneko K., Inoke K., Freitag B., Hungria A.B., Midgley P.A., Hansen T.W.,
Zhang J., Ohara S. and Adschiri T.
Structural and morphological characterization of cerium oxide
nanocrystals prepared by hydrothermal synthesis
Nano Letters 7 (2) (2007) 421