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Prof Paul A. Midgley

B.Sc., Ph.D. (Bristol)

Department of Materials Science and Metallurgy
University of Cambridge
Pembroke Street
Cambridge CB2 3QZ

Office: HREM building room 806
Tel: +44 1223 334561
Fax: +44 1223 334567
Email: pam33@cam.ac.uk

Paul Midgley is Professor of Materials Science and Director of the Electron Microscopy Facility. He is a Professorial Fellow at Peterhouse.

Before moving to Cambridge in 1997, he held two Research Fellowships in the H.H. Wills Physics Laboratory at the University of Bristol, the first funded by The Royal Commission for The Exhibition of 1851 and the second by The Royal Society. He has studied a wide variety of materials by electron microscopy and developed a number of novel electron microscopy techniques. His recent research has concentrated on electron tomography, electron holography, energy filtered TEM and precession electron diffraction.

Paul Midgley's Research

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1. ELECTRON TOMOGRAPHY

3D Reconstruction of Nano-Structures. By recording a tilt series of scanning transmission electron micrographs using high angle scattering or energy filtered images using fixed beam methods it is possible to reconstruct the 3-dimensional structure and compostion of nanoscale materials.

2. ELECTRON HOLOGRAPHY

Using a field emission TEM, off-axis and in-line (Fresnel) electron holography is being used to study a variety of material properties: Electric Fields in biased and non-biased p-n junctions, metal oxide grain boundaries and ferroelectrics; Magnetic Fields in magnetic nanowires, thin film devices and small single domain particles.

3. ENERGY-FILTERED IMAGING AND DIFFRACTION

A number of new techniques have been established to improve the accuracy of core-loss (energy-filtered) imaging of mixed-phase samples. Hybrid modes, such as spectrum-imaging and w-q maps have also been used for more fundamental studies, e.g. plasmon dispersion, surface losses and Cerenkov radiation.

4. AB-INITIO STRUCTURE DETERMINATION BY ELECTRON DIFFRACTION

Using a combination of high resolution electron microscopy, conventional electron diffraction and electron precession, the structure of sub-micron particles can now be determined to an accuracy approaching that of X-ray diffraction.

Paul Midgley's Recent Publications

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Twitchett A.C., Dunin-Borkowski R.E. and Midgley P.A.
Quantitative electron holography of biased semiconductor devices
Phys. Rev. Lett. 88 (2002) 238302

Loudon J.C., Mathur N. and Midgley P.A.
Charge-ordered ferromagnetic phase in La_0.5Ca_0.5MnO₃
Nature 420 (2002) 797

Midgley P.A. and Weyland M.
3D Electron Microscopy in the Physical Sciences: the Development of Z-contrast and EFTEM Tomography
Ultramicroscopy 96 (2003) 413

Arslan I., Yates T.J.V., Browning N.D. and Midgley P.A.
Embedded Nanostructures revealed in Three Dimensions
Science 309 (2005) 2195

Loudon J.C., Cox, S., Williams A., Attfield P., Littlewood P.B., Midgley P.A. and Mathur N.D.
Weak charge-lattice coupling requires reinterpretation of stripes of charge order in La_1-xCa_xMnO₃
Phys. Rev. Lett. 94 (2005) 097202

Tong J, Arslan I and Midgley PA
A novel dual-axis iterative algorithm for electron tomography
Journal of Structural Biology 153 (2006) 55

Gass M.H., Koziol K. K., Windle A.H. and Midgley P.A.,
Four-Dimensional Spectral Tomography of Carbonaceous Nanocomposites
Nano Letters 6 (3) (2006) 376

Barnard J. S., Sharp J., Tong J. R. and Midgley P. A.
High-Resolution Three-Dimensional Imaging of Dislocations
Science 313 (2006) 319

Loudon J. and Midgley P.A.
Micromagnetic Imaging to Determine the Nature of the Ferromagnetic Phase Transition in La_0.7Ca_0.3MnO₃
Phys. Rev. Lett. 96 (2006) 027214

Kaneko K., Inoke K., Freitag B., Hungria A.B., Midgley P.A., Hansen T.W., Zhang J., Ohara S. and Adschiri T.
Structural and morphological characterization of cerium oxide nanocrystals prepared by hydrothermal synthesis
Nano Letters 7 (2) (2007) 421

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