Electron
  Microscopy Group
Research: Aberration-corrected STEM
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See also Research pages for Introduction, Tomography, Electron Diffraction, Superconductivity, Nanomaterials, EELS, Dual Beam

 

 



An FEI Titan 80-300 with a monochromator and probe corrector was installed in 2011. The microscope is designed for high spatial resolution analysis at near atomic level allowing us to record energy loss spectra from interfaces, quantum well structures and a variety of nanoscale structures and devices.

Early test results will be found here once we finish setting up the page.