Electron
  Microscopy Group
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The Electron Microscopy Group is based on the ground floor of the Department of Materials Science and Metallurgy in West Cambridge, and has a long and distinguished history of microscopy innovation, both in technique development and in its application to a variety of materials systems.

The group is responsible for the Department's EM Suite, which hosts a number of state-of-the-art instruments including three field emission gun SEMs, a dedicated high-resolution JEOL 400kV TEM, three field emission gun TEMs (a 300kV Philips instrument, and two FEI Tecnai microscopes, the F20 and the Osiris), a monochromated, probe-corrected (S)TEM (a FEI Titan 80-300), and a DualBeam SEM/FIB microscope (a FEI Helios NanoLab). The group has a wide interest in many aspects of electron microscopy, but particularly in high-resolution imaging, electron holography, electron tomography, energy loss imaging and spectroscopy. In addition, the group continues to be very active in the development of new software for image and spectral analysis, and boasts a large collection of dedicated microscopy software. We work closely with many groups in the Department and elsewhere and investigate many different materials, including super- and semiconductors, metals, oxides and alloys, and biomaterials.

These are exciting times for electron microscopy. Over the past few years, a number of new microscopes have become available that have aberration correctors (for ultra-high spatial resolution), monochromators (for better spectral resolution), new field emission tips (leading to much brighter electron beams) and improved detectors and spectrometers. All of these innovations allow electron microscopy to stay at the cutting edge of nanoscale materials research.

Prof Paul A Midgley
October 2013


Prof P Midgley